mirror of
https://github.com/tianocore/edk2
synced 2026-08-27 00:23:19 -04:00
4d024b0cde
AArch64 does not generate divide-by-zero exceptions like x86. Yet the current generate exception test is using this operation to attempt triggering exceptions. This change abstracted the exception generation logic into per-arch files and use undefined instruction to trigger AArch64 exceptions. Signed-off-by: Kun Qin <kun.qin@microsoft.com>
41 lines
1.6 KiB
C
41 lines
1.6 KiB
C
/** @file
|
|
This is a sample to demonstrate the usage of the Unit Test Library that
|
|
supports the PEI, DXE, SMM, UEFI Shell, and host execution environments.
|
|
This test case generates an exception. For some host-based environments, this
|
|
is a fatal condition that terminates the unit tests and no additional test
|
|
cases are executed. On other environments, this condition may be report a unit
|
|
test failure and continue with additional unit tests.
|
|
|
|
Copyright (c) 2024, Intel Corporation. All rights reserved.<BR>
|
|
SPDX-License-Identifier: BSD-2-Clause-Patent
|
|
|
|
**/
|
|
#include <PiPei.h>
|
|
#include <Uefi.h>
|
|
#include <Library/UnitTestLib.h>
|
|
|
|
/**
|
|
Sample unit test the triggers an unexpected exception
|
|
|
|
@param[in] Context [Optional] An optional parameter that enables:
|
|
1) test-case reuse with varied parameters and
|
|
2) test-case re-entry for Target tests that need a
|
|
reboot. This parameter is a VOID* and it is the
|
|
responsibility of the test author to ensure that the
|
|
contents are well understood by all test cases that may
|
|
consume it.
|
|
|
|
@retval UNIT_TEST_PASSED The Unit test has completed and the test
|
|
case was successful.
|
|
@retval UNIT_TEST_ERROR_TEST_FAILED A test case assertion has failed.
|
|
**/
|
|
UNIT_TEST_STATUS
|
|
EFIAPI
|
|
GenerateUnexpectedException (
|
|
IN UNIT_TEST_CONTEXT Context
|
|
)
|
|
{
|
|
asm volatile ("udf #0");
|
|
|
|
return UNIT_TEST_PASSED;
|
|
}
|